[IEEE IEEE MTT-S International Microwave Symposium - IMS 2003 - Philadelphia, PA, USA (8-13 June 2003)] IEEE MTT-S International Microwave Symposium Digest, 2003 - A scalable model for the substrate resistance in multi-finger RF MOSFETs
Jeonghu Han,, Hyungcheol Shin,Volume:
3
Year:
2003
Language:
english
DOI:
10.1109/mwsym.2003.1210577
File:
PDF, 233 KB
english, 2003