Study of defects in optoelectronic materials using a scanning acoustic microscope
Sulewski, P. E., Dynes, R. C., Mahajan, S., Bishop, D. J.Volume:
54
Year:
1983
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.331790
File:
PDF, 702 KB
english, 1983