[IEEE 2003 Bipolar/BiCMOS Circuits and Technology Meeting...

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[IEEE 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Portland, OR, USA (May 12-16, 2003)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Proof-of-concept experiments for negative ton driver beams for heavy ion fusion

Grisham, L.R., Hahto, S.K., Hahto, S.T., Kwan, J.W., Leung, K.N.
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Volume:
5
Year:
2003
Language:
english
DOI:
10.1109/pac.2003.1289897
File:
PDF, 230 KB
english, 2003
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