Remaining Service Life Diagnostic Technology of Phenol...

IEEE Transactions on Dielectrics and Electrical Insulation 2008 / 04 Vol. 15; Iss. 2

Remaining Service Life Diagnostic Technology of Phenol Insulators for Circuit Breakers

Miki, S., Hasegawa, T., Umemura, S., Okazawa, H., Otsuka, Y., Matsuki, H., Tsunoda, S., Inujima, H.
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Volume:
15
Language:
english
Journal:
IEEE Transactions on Dielectrics and Electrical Insulation
DOI:
10.1109/tdei.2008.4483467
Date:
April, 2008
File:
PDF, 3.09 MB
english, 2008
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