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[IEEE 2010 11th Latin American Test Workshop - LATW - Punta del Este, Uruguay (2010.03.28-2010.03.31)] 2010 11th Latin American Test Workshop - Reliability analysis of small delay defects in vias located in signal paths
Villacorta, Hector, Champac, Victor, Hawkins, Chuck, Segura, JaumeYear:
2010
Language:
english
DOI:
10.1109/latw.2010.5550366
File:
PDF, 222 KB
english, 2010