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[Japan Soc. Appl. Phys 2001 Symposium on VLSI Technology. Digest of Technical Papers - Kyoto, Japan (12-14 June 2001)] 2001 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.01 CH37184) - Scaling towards 35 nm gate length CMOS
Bin Yu,, Haihong Wang,, Qi Xiang,, An, J.X., Joong Jeon,, Ming-Ren Lin,Year:
2001
Language:
english
DOI:
10.1109/vlsit.2001.934921
File:
PDF, 253 KB
english, 2001