Regression procedure for determining the dopant profile in...

Regression procedure for determining the dopant profile in semiconductors from scanning capacitance microscopy data

Marchiando, J. F., Kopanski, J. J.
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Volume:
92
Year:
2002
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1512686
File:
PDF, 411 KB
english, 2002
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