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Simulating and interpreting Kelvin probe force microscopy images on dielectrics with boundary integral equations
Shen, Yongxing, Barnett, David M., Pinsky, Peter M.Volume:
79
Year:
2008
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.2885679
File:
PDF, 737 KB
english, 2008