[IEEE 2005 6th International Conference on ASIC - Shanghai,...

[IEEE 2005 6th International Conference on ASIC - Shanghai, China (24-27 Oct. 2005)] 2005 6th International Conference on ASIC - Modeling of Capacitor Array Mismatch Effect in Embedded CMOS CR SAR ADC

Zengjin Lin,, Lungui Zhong,, Jiabin Sun,, Shanhong Xia,, Haigang Yang,

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Volume:

Year:

2005

Language:

english

DOI:

10.1109/ICASIC.2005.1611492

File:

PDF, 935 KB

english, 2005

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