Instability induced tunneling and repeatable charge...

Instability induced tunneling and repeatable charge injection to SiO[sub 2] surfaces by electrostatic force microscopy

Klein, L. J., Williams, C. C.
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Volume:
96
Year:
2004
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1777397
File:
PDF, 329 KB
english, 2004
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