[IEEE 2013 IEEE 19th International On-Line Testing...

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[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Measuring the performance impact of permanent faults in modern microprocessor architectures

Foutris, Nikos, Gizopoulos, Dimitris, Kalamatianos, John, Sridharan, Vilas
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Year:
2013
DOI:
10.1109/iolts.2013.6604075
File:
PDF, 1.61 MB
2013
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