[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Measuring the performance impact of permanent faults in modern microprocessor architectures
Foutris, Nikos, Gizopoulos, Dimitris, Kalamatianos, John, Sridharan, VilasYear:
2013
DOI:
10.1109/iolts.2013.6604075
File:
PDF, 1.61 MB
2013