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[Int. Test Conference International Test Conference 2000 - Atlantic City, NJ, USA (3-5 Oct. 2000)] Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) - A new paradigm in test for the next millennium
Katz, J., Rajsuman, R.Year:
2000
Language:
english
DOI:
10.1109/test.2000.894239
File:
PDF, 1009 KB
english, 2000