[IEEE 2009 IEEE Circuits and Systems International...

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[IEEE 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Chengdu , China (2009.04.28-2009.04.29)] 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Method of Testability Index Determination Based on Generalized Stochastic Petri Net

Su, Yongding, Qiu, Jing, Liu, Guanjun, Xu, Yuguo, Qian, Yanling
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Year:
2009
Language:
english
DOI:
10.1109/cas-ictd.2009.4960839
File:
PDF, 296 KB
english, 2009
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