[IEEE 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Chengdu , China (2009.04.28-2009.04.29)] 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Method of Testability Index Determination Based on Generalized Stochastic Petri Net
Su, Yongding, Qiu, Jing, Liu, Guanjun, Xu, Yuguo, Qian, YanlingYear:
2009
Language:
english
DOI:
10.1109/cas-ictd.2009.4960839
File:
PDF, 296 KB
english, 2009