[IEEE IEEE Custom Integrated Circuits Conference - Boston, MA, USA (13-16 May 1990)] IEEE Proceedings of the Custom Integrated Circuits Conference - Defect analysis and test generation for gate oxide shorts in CMOS ICs
Syed, S.I., Wu, D.M.Year:
1990
Language:
english
DOI:
10.1109/cicc.1990.124823
File:
PDF, 420 KB
english, 1990