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Statistical Prediction and Measurement of Induced Voltages on Components Within Complicated Enclosures: A Wave-Chaotic Approach
Hemmady, Sameer, Antonsen, Thomas M., Ott, Edward, Anlage, Steven M.Volume:
54
Language:
english
Journal:
IEEE Transactions on Electromagnetic Compatibility
DOI:
10.1109/temc.2011.2177270
Date:
August, 2012
File:
PDF, 1.08 MB
english, 2012