[IEEE Proceedings of the Seventh IEEE CPMT Conference on High Density Microsystem Design and Packaging and Components Failure Analysis - 2005 - Shanghai (2005.06.27-2005.06.29)] 2005 Conference on High Density Microsystem Design and Packaging and Component Failure Analysis - A 0.18 μm CMOS Ultra-Wideband Low-Noise Amplifier with High IIP3
Teemu Peltonen,, Meigen Shen,, Tero Koivisto,, Xinzhong Duo,, Esa Tjukanoff,, Li-Rong Zheng,, Hannu Tenhunen,Year:
2005
Language:
english
DOI:
10.1109/hdp.2005.251445
File:
PDF, 111 KB
english, 2005