Dependence of Al layer growth mode on Cr underlayer thickness in molecular-beam epitaxy of (001) Al/Cr superlattices
Kingetsu, Toshiki, Kamada, Yasuhiro, Yamamoto, MasahikoVolume:
88
Year:
2000
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1305461
File:
PDF, 517 KB
english, 2000