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[IEEE 21st IEEE Convention of the Electrical and Electronic Engineers in Israel. Proceedings - Tel-Aviv, Israel (11-12 April 2000)] 21st IEEE Convention of the Electrical and Electronic Engineers in Israel. Proceedings (Cat. No.00EX377) - Pattern detection using a maximal rejection classifier

Elad, M., Hel-Or, Y., Keshet, R.
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Year:
2000
Language:
english
DOI:
10.1109/eeei.2000.924366
File:
PDF, 130 KB
english, 2000
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