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[IEEE 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2012.06.10-2012.06.11)] 2012 IEEE Silicon Nanoelectronics Workshop (SNW) - Low standby power charge trap flash memory with tunneling field effect transistor
Han, Min Su, Lee, Jong Ho, Seo, Dongsun, Park, Chong-Dae, Oh, Youngcheol, Cho, Il HwanYear:
2012
Language:
english
DOI:
10.1109/snw.2012.6243349
File:
PDF, 316 KB
english, 2012