Thickness-induced stabilization of ferroelectricity in...

Applied Physics Letters 2002 Vol. 81; Iss. 5

Thickness-induced stabilization of ferroelectricity in SrRuO[sub 3]/Ba[sub 0.5]Sr[sub 0.5]TiO[sub 3]/Au thin film capacitors

Sinnamon, L. J., Bowman, R. M., Gregg, J. M.
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Volume:
81
Year:
2002
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.1496144
File:
PDF, 381 KB
english, 2002
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