[IEEE 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Chicago, Illinois, USA (2009.10.7-2009.10.9)] 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Improving the Detectability of Resistive Open Faults in Scan Cells
Yang, Fan, Chakravarty, Sreejit, Devta-Prasanna, Narendra, Reddy, Sudhakar M., Pomeranz, IrithYear:
2009
Language:
english
DOI:
10.1109/dft.2009.30
File:
PDF, 477 KB
english, 2009