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Theoretical analysis of thin film epitaxial growth monitored by differential reflectance
Yang, Guo-Zhen, Li, Zhi-Yuan, Gu, Ben-Yuan, Lee, S. T.Volume:
87
Year:
2000
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.371934
File:
PDF, 344 KB
english, 2000