![](/img/cover-not-exists.png)
Transient Analysis of an Extended Drift Region in a 6H-SiC Diode Formed by a Single Alpha Particle Strike and Its Contribution to the Increased Charge Collection
Iwamoto, N., Onoda, S., Makino, T., Ohshima, T., Kojima, K., Koizumi, A., Uchida, K., Nozaki, S.Volume:
58
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2010.2096432
Date:
February, 2011
File:
PDF, 489 KB
english, 2011