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[IEEE 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Osaka, Japan (2013.3.25-2013.3.28)] 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) - A novel test structure to implement a programmable logic array using split-gate flash memory cells
Om'mani, H., Tadayoni, M., Thota, N., Ian Yue,, Nhan Do,Year:
2013
Language:
english
DOI:
10.1109/icmts.2013.6528170
File:
PDF, 1.34 MB
english, 2013