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[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Study of C4F8 gas for etch process in slow erase failure of flash memory devices
Sang il Hwang,, Kim, Yeong sil, Ki chae Yoon,, Sang kwon Kim,, Young sun Ko,Year:
2011
Language:
english
DOI:
10.1109/ipfa.2011.5992772
File:
PDF, 570 KB
english, 2011