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[Institute of Electrical and Electronics Engineers 1985 IEEE International Conference on Robotics and Automation - St. Louis, MO, USA (March 1985)] Proceedings. 1985 IEEE International Conference on Robotics and Automation - Contour tracing for precision measurement

Dunkelberger, K., Mitchell, O.
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Volume:
2
Year:
1985
Language:
english
DOI:
10.1109/robot.1985.1087356
File:
PDF, 538 KB
english, 1985
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