Thermal behavior of hafnium-based ultrathin films on silicon
Pezzi, R. P., Morais, J., Dahmen, S. R., Bastos, K. P., Miotti, L., Soares, G. V., Baumvol, I. J. R., Freire, F. L.Volume:
21
Year:
2003
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.1575218
File:
PDF, 392 KB
english, 2003