[IEEE 2008 15th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2008) - St. Julien's, Malta (2008.08.31-2008.09.3)] 2008 15th IEEE International Conference on Electronics, Circuits and Systems - Yield model characterization for analog integrated circuit using Pareto-optimal surface
Ali, Sawal, Wilcock, Reuben, Wilson, Peter, Brown, AndrewYear:
2008
Language:
english
DOI:
10.1109/ICECS.2008.4675065
File:
PDF, 385 KB
english, 2008