Reciprocal space mapping of phase transformation in epitaxial PbTiO[sub 3] thin films using synchrotron x-ray diffraction
Lee, K. S., Baik, S.Volume:
85
Year:
1999
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.369195
File:
PDF, 299 KB
english, 1999