![](/img/cover-not-exists.png)
A combined time-of-flight and electrostatic analyzer for low-energy ion scattering
Denier van der Gon, A. W., Reijme, M. A., Rumphorst, R. F., Maas, A. J. H., Brongersma, H. H.Volume:
70
Year:
1999
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1150011
File:
PDF, 318 KB
english, 1999