[IEEE 2006 International Conference on Simulation of Semiconductor Processes and Devices - Monterey, CA, USA (2006.09.6-2006.09.8)] 2006 International Conference on Simulation of Semiconductor Processes and Devices - TCAD Modeling of Negative Bias Temperature Instability
Grasser, T., Entner, R., Triebl, O., Enichlmair, H., Minixhofer, R.Year:
2006
Language:
english
DOI:
10.1109/sispad.2006.282902
File:
PDF, 4.70 MB
english, 2006