Margin analysis of quantum flux parametron logic gates

Margin analysis of quantum flux parametron logic gates

Hosoya, M., Hioe, W.
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Volume:
3
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/77.257229
Date:
June, 1993
File:
PDF, 678 KB
english, 1993
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