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[IEEE 2013 IEEE 63rd Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2013.05.28-2013.05.31)] 2013 IEEE 63rd Electronic Components and Technology Conference - Investigation of charge induced bond pad corrosion
Tsao, Pei-Haw, Chiu, Hung-Yu, Liao, H. C., Chen, K. C., Sung, M. C., Chen, Worth, Xu, AntaiYear:
2013
Language:
english
DOI:
10.1109/ectc.2013.6575777
File:
PDF, 485 KB
english, 2013