[IEEE 23rd International Conference on Microelectronics (MIEL 2002) - Nis, Yugoslavia (12-15 May 2002)] 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595) - Simulation of nanometer-scale MOSFET's with ultra-thin gate oxide including full 2-dimensional quantum mechanical effects and gate tunneling current
Yutao Ma,, Lifeng Chen,, Jing Wang,, Lilin Tian,, Zhiping Yu,, Litian Liu,, Zhijian Li,Volume:
2
Year:
2002
Language:
english
DOI:
10.1109/miel.2002.1003292
File:
PDF, 334 KB
english, 2002