Characterization of CdTe polycrystalline films by x-ray...

Characterization of CdTe polycrystalline films by x-ray photoelectron and Auger spectroscopies

Zelaya, O.
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Volume:
7
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.576126
Date:
March, 1989
File:
PDF, 524 KB
english, 1989
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