![](/img/cover-not-exists.png)
[IEEE 20th International Reliability Physics Symposium - San Diego, NV, USa (1982.03.30-1982.04.1)] 20th International Reliability Physics Symposium - Diffusivity of Moisture in Thin Films
McInerney, Edward J., Flinn, Paul A.Year:
1982
Language:
english
DOI:
10.1109/irps.1982.361940
File:
PDF, 3.22 MB
english, 1982