High energy x-ray diffraction/x-ray fluorescence...

Review of Scientific Instruments 2009 Vol. 80; Iss. 12

High energy x-ray diffraction/x-ray fluorescence spectroscopy for high-throughput analysis of composition spread thin films

Gregoire, John M., Dale, Darren, Kazimirov, Alexander, DiSalvo, Francis J., van Dover, R. Bruce
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Volume:
80
Year:
2009
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3274179
File:
PDF, 996 KB
english, 2009
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