[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Equipment degradation monitoring for sustained reliability
Kumar, Edwin Vijay, Sundar, A. Syam, Chaturvedi, Sanjay K.Year:
2011
Language:
english
DOI:
10.1109/rams.2011.5754473
File:
PDF, 557 KB
english, 2011