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[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Raman-IR micro-thermography tool for reliability and failure analysis of electronic devices
Sarua, A., Pomeroy, J., Kuball, M., Falk, A., Albright, G., Uren, M. J., Martin, T.Year:
2008
Language:
english
DOI:
10.1109/ipfa.2008.4588160
File:
PDF, 410 KB
english, 2008