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Degradation of Si/sub 1-x/Ge/sub x/ epitaxial heterojunction bipolar transistors by 1-MeV fast neutrons
Ohyama, H., Vanhellemont, J., Takami, Y., Hayama, K., Sunaga, H., Poortmans, J., Caymax, M.Volume:
42
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.488749
Date:
January, 1995
File:
PDF, 821 KB
english, 1995