Thickness dependence of critical currents and depth profiling of transport properties in high rate in-situ grown YBa/sub 2/Cu/sub 3/O/sub 7-x/ films
Jo, W., Ohnishi, T., Huh, J.U., Hammond, R.H., Beasley, M.R.Volume:
13
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/tasc.2003.812015
Date:
June, 2003
File:
PDF, 385 KB
english, 2003