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[IEEE 2009 International Conference of Soft Computing and Pattern Recognition - Malacca, Malaysia (2009.12.4-2009.12.7)] 2009 International Conference of Soft Computing and Pattern Recognition - Surface Defect Characterization in Polishing Process Using Contour Dispersion
Besari, Adnan Rachmat Anom, Zamri, Ruzaidi, Rahman, Khairul Anuar A., Palil, Md. Dan Md., Prabuwono, Anton SatriaYear:
2009
Language:
english
DOI:
10.1109/socpar.2009.142
File:
PDF, 698 KB
english, 2009