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[IEEE Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (28-29 July 2003)] Proceedings the Third IEEE Workshop on Internet Applications. WIAPP 2003 - Systematic memory test generation for DRAM defects causing two floating nodes
Al-Ars, Z., van de Goor, Ad.J.Year:
2003
Language:
english
DOI:
10.1109/mtdt.2003.1222357
File:
PDF, 322 KB
english, 2003