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Spectroscopic-ellipsometry characterization of the interface layer of PbZr[sub 0.40]Ti[sub 0.60]O[sub 3]/LaNiO[sub 3]/Pt multilayer thin films
Hu, Z. G., Huang, Z. M., Wu, Y. N., Wang, G. S., Meng, X. J., Shi, F. W., Chu, J. H.Volume:
22
Year:
2004
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.1761160
File:
PDF, 382 KB
english, 2004