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[IEEE 2010 35th IEEE Photovoltaic Specialists Conference (PVSC) - Honolulu, HI, USA (2010.06.20-2010.06.25)] 2010 35th IEEE Photovoltaic Specialists Conference - Study of silicon-silicon nitride interface properties on flat and textured surfaces by deep level transient spectroscopy
Gong, Chun, Simoen, Eddy, Zhao, Lu, Posthuma, Niels E., Van Kerschaver, Emmanuel, Poortmans, Jef, Mertens, RobertYear:
2010
Language:
english
DOI:
10.1109/pvsc.2010.5617172
File:
PDF, 1.47 MB
english, 2010