Time Evolution of Single-Event Burnout in Vertical Power MOSFETs and Implications for Mitigation Strategies
Romero, Eduardo, Demarco, Gustavo Luis, Tais, Carlos E.Volume:
11
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2010.2102761
Date:
March, 2011
File:
PDF, 769 KB
english, 2011