[IEEE 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA, USA (2007.02.11-2007.02.15)] 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variations in SoCs
Fukazawa, Mitsuya, Matsuno, Tetsuro, Uemura, Toshifumi, Akiyama, Rei, Kagemoto, Tetsuya, Makino, Hiroshi, Takata, Hidehiro, Nagata, MakotoYear:
2007
Language:
english
DOI:
10.1109/isscc.2007.373407
File:
PDF, 2.89 MB
english, 2007