Reciprocal space mapping by spot profile analyzing low...

Review of Scientific Instruments 2005 Vol. 76; Iss. 8

Reciprocal space mapping by spot profile analyzing low energy electron diffraction

Meyer zu Heringdorf, Frank-J., Horn-von Hoegen, Michael
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Volume:
76
Year:
2005
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1988287
File:
PDF, 690 KB
english, 2005
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