Eliminating infant mortality in metallized film capacitors...

Microelectronics Reliability 2014 / 09 Vol. 54; Iss. 9-10

Eliminating infant mortality in metallized film capacitors by defect detection

McCluskey, F.P., Li, N.M., Mengotti, E.
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.090
Date:
September, 2014
File:
PDF, 1.78 MB
english, 2014
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