![](/img/cover-not-exists.png)
[IEEE 50th ARFTG Conference Digest - Portland, OR, USA (1997.12.4-1997.12.5)] 50th ARFTG Conference Digest - A High Throughput On-Wafer RFIC Tester
Kerwin, K.J., Bugely, F.L., Chavez, R., Marroquin, J., Laurell, R., Veteran, D., Olney, D., McGinty, D., Madonna, G. L.Year:
1997
Language:
english
DOI:
10.1109/arftg.1997.327269
File:
PDF, 600 KB
english, 1997